FreeTDS Development Group

[Brian Bruns <camber AT ais.org>]

Ok, tds_alloc_login()/tds_free_login() are clean.  
tds_get_config()/tds_free_config() have a slight mem leak, and there's 
another one somewhere in tds_connect() I have still to resolve. Doesn't 
look terribly bad though.

Brian

On Wed, 3 Jul 2002, Coleman, Dave wrote:

> I just downloaded the newest snapshot, and applied the same test to the unit
> directory and the leak still exists.  My application also exhibits the same
> behavior.  For what it's worth, it appears that the leak is slightly smaller
> now than with the snapshot I was using.
> 
> > -----Original Message-----
> > From:       Brian Bruns [SMTP:camber AT ais.org]
> > Sent:       Wednesday, July 03, 2002 12:33 PM
> > To: TDS Development Group
> > Subject:    [freetds] Re: Proper procedure for logging in and out
> > multiple times
> > 
> > I applied a patch with some mem leak cleanups in it yesterday...or the day
> > before.  Is your snapshot version older than that?
> > 
> > Brian
> > 
> > > I have an application using the freetds C-API that needs to have a
> > > non-persistant connection to a MS-SQL 7.0 Server.  I have configured
> > freetds
> > > to use TDS v4.2, and I have tried both version 0.53 and the latest
> > snapshot.
> > > 
> > > This application is a manufacturing systems control program and it must
> > use
> > > a non-persistant connection, as machine operators can shut power off at
> > any
> > > time (no, they really shouldn't, but they do), orphaning open
> > connections to
> > > the SQL server.  Using the code examples in the unittest directory, I
> > > constructed a package with non-persistant behaviour for this purpose.  I
> > > have been experiencing a memory leak with my application, however; and
> > after
> > > careful and thorough debugging traced it back to the tds_login(),
> > > tds_connect(), tds_free_socket(), tds_free_login() function group.
> > > 
> > > I modified t0001.c to log in and out multiple times.
> > > 
> > > This is the main() function from my modified unit test.
> > > 
> > > int main()
> > >     {
> > >     TDSLOGIN *login;
> > >     TDSSOCKET *tds;
> > >     int ret;
> > >     int verbose = 0;
> > >     int i = 0;
> > >     while( i++<1000 )
> > >         {
> > >         fprintf(stdout, "%s: Testing login, logout\n", __FILE__);
> > >         ret = try_tds_login(&login, &tds, __FILE__, verbose);
> > >         if( ret != TDS_SUCCEED )
> > >             {
> > >             fprintf(stderr, "try_tds_login() failed\n");
> > >             return 1;
> > >             }
> > > 
> > >         try_tds_logout(login, tds, verbose);
> > >         }
> > >     return 0;
> > >     }
> > > 
> > > Is there some clean-up call that I need to make for this code to be
> > > re-usable?  The unit test code leaks exactly the same memory as my
> > > application.  I have verified my own memory operations by commenting out
> > the
> > > freetds function calls in my object and running the same loop on my
> > code,
> > > new'ing and delet'ing every time.  It doesn't leak.
> > > 
> > > Thank you in advance for your help,
> > > 
> > > Dave Coleman
> > > Software Engineer
> > > TI Automotive - Meriden, CT
> > > dColeman AT us.tiauto.com
> > 
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